Scanning Microscopy for Nanotechnology formatIsbn:Hardcover - 9780387333250 - Alicia "Faolin" Moeck
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- Alicia "Faolin" Moeck
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Scanning Microscopy for Nanotechnology formatIsbn:Hardcover - 9780387333250 - Alicia "Faolin" MoeckScanning electron microscopy (SEM) can be exploited not only for nanomaterials characterization but also integrated with new technologies for in situ nanomaterials engineering and manipulation. Scanning Microscopy for Nanotechnology addresses the rapid development of these techniques for nanotechnology, in both technique and application chapters by leading practitioners. The book covers topics including nanomaterials imaging, X ray microanalysis, high
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