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NIKON M PLAN 40X ELWD OBJECTIVE PLAN APOCHROMAT High-magnification semiconductor and IC surface

SKU 79163481580
4.5
Description

High-magnification semiconductor and IC surface inspection

0 µm pixel size provides good sensitivity across a range of microscopy techniques

Live-cell imaging requiring high fluorescence sensitivity

This condenser is essential for phase contrast

LEICA M165C HIGH PERFORMANCE STEREO MICROSCOPE

NIKON M PLAN 40X ELWD OBJECTIVE PLAN APOCHROMAT High-magnification semiconductor and IC surfaceNIKON M PLAN 40X ELWD OBJECTIVE RMS THREAD 210 TUBE LENGTH WORKING DISTANCE: 10. 1 MM NUMERICAL APERTURE: 0. 50 CATALOG NUMBER: 78776 CONDITION: EXCELLENT UNIVERSITY PURCHASE ORDERS ACCEPTED THANK YOU FOR VIEWING AND PLEASE FEEL FREE TO CALL OR EMAIL WITH ANY QUESTIONS

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